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Ivanov, Dentcho V. - 21 ETDs Online (Report generated on 05/19/2013)

Committee Chair/Co-chair
Year Author Title
2009 James, Teena, MS Aptamer-based nano-scale dielectric sensor for protein detection
2009 Sebastian Mannoor, Manu, MS Dual parametric sensors for highly sensitive nucleic acid detection
Committee Member
Year Author Title
2007 Jin, Quan, PhD Direct simulations of cells motions and deformations in flow
2007 Patan, Mustafa Khan, MS Titanium nitride as an electrode material for high charge density applications
2006 Banerjee, Amitra, MS Fabrication and characterization of back illuminated CMOS photodiode array
2006 Verdoni, Luigi Pollara, MS Submicron patterning using laser interference lithography
2005 Rabus, Markus, MS Emissivity of patterned silicon wafers in rapid thermal processing
2002 Balakrishnan, Aravind, MS Recent advances in silicon light emitting diodes
2002 Chawda, Samrat G, MS Formation & characterization of p/n shallow junctions in sub-micron MOSFETs
2002 Kim, Minhee, PhD A microfabricated microconcentrator for sensors and chromatography
2002 Madishetty, Sridhar, MS Formation and characterization of n/p shallow junctions in sub-micron MOSFETs
2002 Mehta, Vishal R., MS Electrical properties of ultra thin Al2O3 and HfO2 films as gate dielectrics in MOS technology
2001 Beggans, Michael H., PhD Ultrathin silicon wafer bonding physics and applications
2001 Luo, DianHong, PhD Development of an integrated photonic sensor for monitoring hazardous organics
2001 Mokashi, Prakash, MS Silicon based IR filters
2001 Shenoy, Anand G., MS Optical properties of photonic crystals
2001 Wu, Xingtao, PhD Electrostatic micro actuators for mirror and other applications
2000 Jin, Lei, MS Preparation and properties of tantalum silicide films on silicon substrates
2000 Moholkar, Pushkar, MS Design and fabrication of optical resonators
2000 Ramanuja, Narahari, PhD Synthesis and characterization of low pressure chemically vapor deposited boron nitride and titanium nitride films
2000 Tangirala, Prasant, MS Current-voltage characteristics of TaSi2/Si and MOS devices using Labview

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